Supported by the 863 High-Technology Research and Development Program of China(No.2009AA03Z442);the National Natural Science Foundation of China(No.61077074);the Science and Technology Department of Jilin Province(No.20090422)
Ternary In-rich AlxIn1-x N films were successfully grown on Si (111) and (0001) sapphire substrates by radio-frequency magnetron sputtering on a relatively Al-rich AlxIn1-x N layer after AlN buffer. X-ray diffract...
Funded by the National Natural Science Foundation of China;National 863 Program of China(Nos.50872115and2009AA03Z203)
CeO2 and Ce0.8M0.2O2-d films (M = Mn, Y, Gd, Sm, Nd and La) with (00l) preferred orientation have been prepared on biaxially textured Ni-W substrates by metal organic decomposition (MOD) method. The factors infl...
Funded by the International Science and Technology Cooperation Project (No.2009DFB50470);the National Nature Science Foundation of China (No.50802071);International Science and Technology Cooperation Project of Hubei Province (No.2010BFA017)
MgO thin films were deposited on Si(100) substrates by laser ablation under various substrate temperatures (Tsub),expecting to provide a candidate buffer layer for the textured growth of functional perovskite oxid...
Funded by the Doctorial Start-up Fund of the Department of Science and Technology of Liaoning Province (20081030)
1 064 nm, 532 nm frequency-doubled antireflection (AR) coatings with buffer layer of SiO2 between the coating and the substrate were fabricated by the electron beam evaporation technology on the substrate of lithium...
Fundeded by the Doctorial Start-up Fund of the Department of Science and Technology of Liaoning Province(20081030);S&T Plan Project of the Educational Department of Liaoning Province(2008224)
Frequency-doubled antireflection coatings simultaneously effective at 1064 nm and 532 nm were deposited on the lithium triborate (LiB3O5 or LBO) crystals using the electron beam evaporation method. Comparing with th...
Ni 0.81Fe 0.19) 0.66Cr 0.34 has a high resistivity and a crystal structure close to that of Ni 0.81Fe 0.19.The electrical and X-ray diffraction measurements prove that a thin NiFeCr seed layer induce...