Supported by the National Natural Science Foundation of China under Grant No 60576065, and the National High-Technology Research and Development Programme of China under Grant Nos 2006AA05Z405 and 2006AA04Z345.
We observe a strong correlation between the ring oxidation-induced stack faults (OISF) formed in the course of phosphor diffusion and the efficiency of Czochralski-grown silicon solar cells. The main reason for ring...