supported by the National Science Foundation under Grant No.CMMI-1844821;supported by the NSF through the University of Wisconsin Materials Research Science Center(Grant No.DMR-1720415).
With the growing demand for the fabrication of microminiaturized components,a comprehensive understanding of material removal behavior during ultra-precision cutting has become increasingly significant.Single-crystal ...
Supported by the National Natural Science Foundation of China under Grant Nos 61204006 and 61574108;the Fundamental Research Funds for the Central Universities under Grant No JB141101;the Foundation of Key Laboratory of Nanodevices and Applications of Suzhou Institute of Nano-Tech and Nano-Bionics of Chinese Academy of Sciences under Grant No 15CS01
The effect of a self-organized SiNs interlayer on the defect density of (1122) semipolar GaN grown on 7n-plane sapphire is studied by transmission electron microscopy, atomic force microscopy and high resolution x-r...
supported by the Special Funds for the Major State Basic Research Project (Grant No. 2011CB301900);the High-Tech Research Project (Grant No. 2011AA03A103);the National Natural Science Foundation of China (Grant Nos. 60990311, 60820106003, 60721063,60906025, 60936004 and 61176063);the Natural Science Foundation of Jiangsu Province (Grant Nos. BK2011010, BK2009255, BK2010178 andBK2010385);the Research Funds from NJU-Yangzhou Institute of Opto-electronics
The m-plane InN (1 100) epilayers have been grown on a LiAlO2 (1 0 0) substrate by a two-step growth method using a met- al-organic chemical vapor deposition (MOCVD) system. The low temperature InN buffer layer ...
The experimental part of this work was performed at University of California,Santa Barbara.This study is based upon work partially supported as part of the‘Center for Energy Efficient Materials’at University of California,Santa Barbara,an Energy Frontier Research Center funded by the US Department of Energy,Office of Science,Office of Basic Energy Sciences under Award Number DE-SC0001009 and by the Solid State Lighting and Energy Center(SSLEC)at the University of California,Santa Barbara.
Light-emitting diodes are becoming the alternative for future general lighting applications,with huge energy savings compared to conventional light sources owing to their high efficiency and reliability.Polarized ligh...
Project supported by State Key Development Program for Basic Research of China(No.2006CB6049);the National Hi-Tech Researchand Development Program of China(No.2006AA03A142);the National Natural Science Foundation of China(Nos.60721063,60731160628,60820106003)
A 0.09 mm m-plane GaN film is deposited via hydride vapor phase epitaxy (HVPE) on a γ-LiAlO2 substrate. To research the anisotropy between directions with different angles with the c-axis in the m plane, photolumin...
Project supported by the National Natural Science Foundation of China (Grant Nos 60676032,60577030 and 60776042);National Key Basic Research Special Foundation of China (Grant No TG 2007CB307004)
Strain effects on the polarized optical properties of c-plane and m-plane InxGa1-xN were discussed for different In compositions (x = 0, 0.05, 0.10, 0.15) by analyzing the relative oscillator strength (ROS) and en...
The National Basic Research Programme of China under Grant No 2006CB6049, the National High-Tech Research and Development Programme of China under Grant Nos 2006AA03A103, 2006AA03Al18, 2006AA03A142, the National Natural Science Foundation of China under Grant Nos 60390072, 60676057, 60421003, The Research Fund for the Doctoral Programme of Higher Education of China (20050284004)
We report the structural and optical properties of nonpolar m-plane GaN and GaN-based LEDs grown by MOCVD on a 7-LiAlO2 (100) substrate. The TMGa, TMIn and NH3 are used as sources of Ga, In and N, respectively. The ...
This paper reports that the m-plane GaN layer is grown on (200)-plane LiAlO2 substrate by metal-organic chemical wpour deposition (MOCVD) method. Tetragonal-shaped crystallites appear at the smooth surface. Raman ...
LiAlO2 single crvstals doped with Ti at concentration 0.2at.% are grown by the Czochralskl technique with dimensions φ42×55mm. Ti ions in the crystal are quadrivalence proven by comparing the absorption and fluoresc...