Project supported by the National Natural Science Foundation of China(Grant No.62104185);the Fundamental Research Funds for the Central Universities,China(Grant No.JB211103);the National Natural Science Foundation for Distinguished Young Scholars,China(Grant No.61925404);the Wuhu and Xidian University Special Fund for Industry–University-Research Cooperation,China(Grant No.XWYCXY-012021010)。
Dynamic characteristics of the single-crystal Ga N-passivated lateral AlGaN/GaN Schottky barrier diodes(SBDs)treated with proton irradiation are investigated.Radiation-induced changes including idealized Schottky inte...
supported by the funding from National Natural Science Foundation of China(Grants No.61851406,61874128,and U1732268);Frontier Science Key Program of CAS(Grant No.QYZDY-SSWJSC032);Program of Shanghai Academic Research Leader(Grant No.19XD1404600);K.C.Wong Education Foundation(Grant No.GJTD-2019-11);Shenzhen Science and Technology Innovation Program(Grant No.JCYJ20190806142614541).
The semiconductor,β-Ga_(2)O_(3)is attractive for applications in high power electronic devices with low conduction loss due to its ultra-wide bandgap(∼4.9 eV)and large Baliga’s figure of merit.However,the thermal c...
Project supported by the National Natural Science Foundation of China(Grant Nos.61774019,51572033,and 51572241);the Beijing Municipal Commission of Science and Technology,China(Grant No.SX2018-04)
Gallium oxide(Ga_2O_3), a typical ultra wide bandgap semiconductor, with a bandgap of ~4.9 e V, critical breakdown field of 8 MV/cm, and Baliga's figure of merit of 3444, is promising to be used in high-power and high...
supported by the National Natural Science Foundation of China(Grant Nos.61404098,61176070,and 61274079);the Doctoral Fund of Ministry of Education of China(Grant Nos.20110203110010 and 20130203120017);the National Key Basic Research Program of China(Grant No.2015CB759600);the Key Specific Projects of Ministry of Education of China(Grant No.625010101)
In this paper, 1.2 kV, 3.3 kV, and 5.0 kV class 4H-SiC power Schottky barrier diodes (SBDs) are fabricated with three N-type drift layer thickness values of 10 μm, 30μm, and 50 μm, respectively. The avalanche bre...