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Studies on thermal stability,softening behavior and mechanism of an ADS copper alloy at elevated temperatures被引量：1: 《Journal of Materials Science & Technology》2024年第19期79-90,共12页Feixiang Liu Xinhua Liu Guoliang Xie Yuan Wu Cunguang Chen; financially supported by the National Key Research and Development Program of China(No.2020YFB0311101);the National Natural Science Foundation of China(Nos.92066205 and 92266301);the Natural Science Foundation for Distinguished Young Scholars of China(No.51925401);the Youth Foundation of National Natural Science Foundation China(No.52001020).; An Al2O3 dispersion strengthened(ADS)alloy with an ultra-high softening temperature of∼1200 K was fabricated by the in-situ internal oxidation and reduction methods.The evolution of the nanometer Al2O3 particles,grai...; 关键词：ADS copper alloy Nanometer-scaled Al2O3 particles Grain growth Softening mechanism Softening model

Nanometer-scale displacement measurement based on an orthogonal dual Michelson interferometer: 《Chinese Optics Letters》2023年第10期30-35,共6页王菊蔡滋恒于晋龙罗浩马闯; supported in part by the National Natural Science Foundation of China(No.62005194).; In this Letter,we propose a simple structure of an orthogonal type double Michelson interferometer.The orthogonal detection method overcomes the problems of uneven ranging sensitivity and the inability of traditional ...; 关键词：orthogonal detection nanoscale displacement measurement laser interferometer

Deformation-and rupture-controlled friction between PDMS and a nanometer-scale SiO_(x) single-asperity: 《Friction》2023年第9期1755-1770,共16页Arnaud CARON; This work investigates the friction between polydimethylsiloxane(PDMS)and silicon oxide(SiO_(x))in single asperity sliding contact by atomic force microscopy(AFM).Two friction dependences on the normal force are ident...; 关键词：FRICTION adhesion fracture atomic force microscopy(AFM) polydimethylsiloxane(PDMS)

Writing nanometer-scale structures for centimeter-scale color printing: 《Advanced Photonics》2023年第3期23-24,共2页Younghwan Yang Trevon Badloe Junsuk Rho; financially supported by the POSCO-POSTECHRIST Convergence Research Center program funded by POSCO;the National Research Foundation (NRF) grant (NRF2022M3C1A3081312) funded by the Ministry of Science and ICT of the Korean government;the Hyundai Motor Chung Mong-Koo fellowship;the NRF fellowship (NRF2021R1A6A3A13038935) funded by the Ministry of Education of the Korean government;the Institute of Information & Communications Technology Planning & Evaluation (IITP) grant (No. 2019-0-01906, the POSTECH Artificial Intelligence Graduate School program) funded by the MSIT of the Korean government;the POSTECH PIURI fellowship.; Structural coloration,the production of color with nanoscale structures,has steadily gained attention owing to numerous advantages such as environmental friendliness,long-term durability,and vivid coloration compared ...; 关键词：PRINTING DURABILITY gained

A tabletop X-ray tomography instrument for nanometer-scale imaging: reconstructions被引量：1: 《Microsystems & Nanoengineering》2023年第2期249-259,共11页Zachary H.Levine Bradley K.Alpert Amber L Dagel Joseph W.Fowler Edward S.Jimenez Nathan Nakamura Daniel S.Swetz Paul Szypyt Kyle R.Thompson Joel N.Ulom; Sandia National Laboratories is a multimission laboratory managed and operated by National Technology and Engineering Solutions of Sandia LLC(NTESS),a wholly owned subsidiary of Honeywell International Inc,for the U.S.Department of Energy's National Nuclear Security Administration(NNSA)under contract DE-NA0003525;funded in part by the Office of the Director of National Intelligence(ODNI);Intelligence Advanced Research Projects Activity(IARPA);via agreements D2019-1908080004,D2019-1906200003,D2021-2106170004,and FA8702-15-D-0001.; We show three-dimensional reconstructions of a region of an integrated circuit from a 130 nm copper process.The reconstructions employ x-ray computed tomography,measured with a new and innovative high-magnification x-...; 关键词：PROCESS removing PLATINUM

Deep-nanometer-scale terahertz spectroscopy using a transistor geometry with metal nanogap electrodes被引量：2: 《Light(Advanced Manufacturing)》2021年第4期67-79,共13页Ya Zhang Shaoqing Du Kazuhiko Hirakawa; This work was supported by MEXT KAKENHI Grant Number JP15H05868;JSPS KAKENHI Grant Numbers JP20H05660,JP17H01038,JP16H06709;the Canon Science Foundation.; Terahertz(THz)spectroscopy is a powerful tool for characterizing electronic properties and vibronic excitations in various types of solids,liquids,and gases,and it has been extensively used not only for basic science ...; 关键词：TRANSISTOR ANTENNA QUANTUM

Nanometer-scale gradient atomic packing structure surrounding soft spots in metallic glasses被引量：2: 《npj Computational Materials》2018年第1期312-322,共11页Binbin Wang Liangshun Luo Enyu Guo Yanqing Su Mingyue Wang Robert O.Ritchie Fuyu Dong Liang Wang Jingjie Guo Hengzhi Fu; This work was supported by National Natural Science Foundation of China 51425402,51371066,51671073;National Key Research and Development Program of China 2016YFB0301201;R.O.R.was supported by U.S.Department of Energy,Office of Science,Office of Basic Energy Sciences,Materials Sciences and Engineering Division,under Contract No.DE-AC02-05CH11231.; The hidden order of atomic packing in amorphous structures and how this may provide the origin of plastic events have long been a goal in the understanding of plastic deformation in metallic glasses.To pursue this iss...; 关键词：alloy GLASSES metallic

Dispersion characteristics of nanometer-scaled silicon nitride suspended membrane waveguides: 《Journal of Semiconductors》2016年第11期60-66,共7页边丹丹雷勋陈少武; Project supported by the National Natural Science Foundation of China(Nos.61435002,61527823 61321063); We investigate the dispersion properties ofnanometer-scaled silicon nitride suspended membrane wave- guides around the communication wavelength and systematically study their relationship with the key structural param...; 关键词：suspended waveguide group velocity dispersion dispersion engineering frequency comb

Impacts of test factors on heavy ion single event multiple-cell upsets in nanometer-scale SRAM: 《Journal of Semiconductors》2015年第11期63-68,共6页罗尹虹张凤祁郭红霞肖尧赵雯丁李利王园明; Single event multiple-cell upsets（MCU） increase sharply with the semiconductor devices scaling. The impacts of several test factors on heavy ion single event MCU in 65 nm SRAM are studied based on the buildup of MCU...; 关键词：multiple-cell upsets nanometer-scale SRAM test factors device orientation

A novel modified charge pumping method for trapped charge characterization in nanometer-scale devices: 《Journal of Semiconductors》2010年第10期52-56,共5页祝鹏潘立阳古海明谯凤英邓宁许军; Project supported by the National Basic Research Program of China(No.2006CB302700);the National Natural Science Foundation of China(No.60876076);the National Key Scientific and Technological Project of China(No.2009ZX02023-5-3); A new modified method based on the charge pumping technique is proposed and adopted to extract the lateral profiles of oxide charges in an advanced MOSFET. A 0.12 μm SONOS device with 50 nm threshold voltage peak is ...; 关键词：charge pumping trapped charge distribution localized VT

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