Y2000-62067-209 0012437采用微波增强等离子体 MOCVD 生长 CaN=Growthof CaN by microwave plasma enhanced MOCVD[会,英]/Sani,R.A.& Barmawi,M.//1998 IEEE Inter-national Conference on Optoelectronic and MicroelectronicMateria...
Y2000-62004-213 0007255溅射参数对氧化锌薄膜的生长与压电特性的影响=Effect of the sputtering parameters on the growth andpiezoelectric properties of zinc oxide thin film[会,英]/Kutepova,V.P.& Hall,D.A.//Proceedings of 1...
Y98-61303-467 9905949硼的硼增强扩散:超浅结的限制因数=Boron-en-hanced-diffusion of boron:the limiting factor for ultra-shallow junctions[会,英]/Agarwal,A.& Eaglesham,D.J.//1997 IEEE International Electron Devices Meet-...
Y98-61412-3 9904254GaN 的过去、今天和未来=Gallium nitride past、pre-sent,and future[会,英]/Yoder,M.N.//1997 IEEE/Cornell Conference on Advanced Concepts in High SpeedSemiconductor Devices and Circuits.—3~12(V)