supported by the National Natural Science Foundation of China (No.60603049);the National High Technology Research and Development Program of China (Nos.2008AA110901,2007AA01Z112,2009AA01Z125);the State Key Development Program for Basic Research of China (No.2005CB321600);the Beijing Natural Science Foundation (No.4072024)
Content addressable memory (CAM) is widely used and its tests mostly use functional fault models. However, functional fault models cannot describe some physical faults exactly. This paper introduces physical fault m...
supported by the State Key Development Program for Basic Research of China (No. 2005CB321600);the National High Technol-ogy Development Research and Program of China (No. 2008AA110901);the National Natural Science Foundation of China (Nos.60801045, 60803029, 60673146, 60603049);the Beijing Natural Science Foundation (No. 4072024)
This paper presents the design of a 10 Gb/s low power wire-line receiver in the 65 nm CMOS process with 1 V supply voltage. The receiver occupies 300×500 μm2. With the novel half rate period calibration clock data r...