supported by the National Natural Science Foundation of China(No.60606022);the Advanced Fund(No.9140A08050508);the Applied Materials Innovation Fund (Nos.XA-AM-200607,XA-AM-200704)
The intrinsic defects in epitaxial semi-insulating 4H-SiC prepared by low pressure chemical vapor deposition (LPCVD) are studied by electron spin resonance (ESR) with different illumination times. The results show...
The quenched domain mode of the photo-activated charge domain (PACD) in semi-insulating (SI) GaAs photoconductive semiconductor switches (PCSSs) is observed. We find that the quenched domain is induced by the in...
A model is presented to describe a compensation mechanism for semi-insulating 6H-SiC grown with the intentional doping of vanadium. Because we found nitrogen to be the principal shallow donor impurity in SiC by second...
The diffusion behavior of vanadium (V) implanted in SiC is investigated by secondary ion mass spec- trometry. Significant redistribution, especially out-diffusion of vanadium towards the sample surface, is not ob- s...
Properties of Fe-doped semi-insulating (SI) InP with different iron concentrations are studied by using Hall effect,current-voltage ( I-V ),photoluminescence spectroscopy (PL) and photocurrent spectroscopy(PC)measurem...
The free electron concentration of as-grown liquid encapsulated Czochralski (LE C) InP measured by Hall effect is much higher than the concentration of net dono r impurity determined by glow discharge mass spectroscop...
Semi insulating (SI) InP wafers of 50 and 75mm in diameter can be obtained by annealing of undoped liquid encapsulated Czochralski (LEC) InP at 930℃ for 80h.The annealing ambient can be pure phosphorus (PP) or iron ...