Metal-semiconductor field effect transistors (MESFETs) were fabricated on H-terminated polycrystalline diamond.The DC characteristics of the p-channel MESFET showed a maximum drain current density of 204 mA/mm at a ga...
Project supported by the National Natural Science Foundation of China (Grant No. 61076072)
A silicon carbide (SIC) based metal semiconductor field effect transistor (MESFET) is fabricated by using a standard SiC MESFET structure with the application of a dual p-buffer layer and a multi-recessed gate to ...
Project supported by the National Natural Science Foundation of China(No.60606022);the Innovation Engineering of Shaanxi Province, China(No.2008ZDKG-30);the Advanced Research Foundation of China(No.9140A08050508);the Special Fund for Basic Scientific Research of Central Colleges,Chang'an University,China(No.CHD2010JC054)
4H-SiC metal Schottky field effect transistors(MESFETs) and Schottky barrier diodes(SBDs) were irradiated at room temperature with 1 MeV neutrons.The highest neutron flux and gamma-ray total dose were 1×1015 n/cm...
Trapping of hot electron behavior by trap centres located in buffer layer of a wurtzite phase GaN MESFET has been simulated using an ensemble Monte Carlo simulation. The simulated results show the trap centres are res...
In this paper we report on DC and RF simulations and experimental results of 4H-SiC metal semiconductor field effect transistors (MESFETs) on high purity semi-insulating substrates. DC and small-signal measurements ...
supported by the State Key Development Program for Basic Research of China(No.51327010101)
An improved dual-channel 4H-SiC MESFET with high doped n-type surface layer and step-gate structure is proposed, and the static and dynamic electrical performances are analyzed.A high doped n-type surface layer is app...
Project supported by Major State Basic Research Development Program of China (Grant No 51327010101)
This paper reports that multi-recessed gate 4H-SiC MESFETs (metal semiconductor filed effect transistors) with a gate periphery of 5-mm are fabricated and characterized.The multi-recessed region under the gate termi...
Project supported by the National Defense Foundation of China (Grant No 51327010101);the National Natural Science Foundation of China (Grant No 60606022)
A new self-heating effect model for 4H-SiC MESFETs is proposed based on a combination of an analytical and a computer aided design (CAD) oriented drain current model. The circuit oriented expressions of 4H-SiC low-f...
the National Defense Basic Research Program of China(Grant No.51327010101)
A novel empirical large signal direct current (DC)Ⅰ-Ⅴ model is presented considering the high saturation voltage, high pinch-off voltage, and wide operational range of drain voltage for 4H-SiC MESFETs. A compariso...