Supported by the National Key Research and Development Program of China(2021YFA0715503);the Open Foundation of Key Laboratory of Infrared Imaging Materials and Detectors Shanghai Institute of Technical Physics;Chinese Academy of Sciences。
Supported by National Natural Science Foundation of China(61172151,60876081);National High Technology Research and Development Program of China(863 Program)(2009AA04Z317);Science and Technology Commission of Shanghai Municipality,(14DZ1105102)
Supported by the Research and Innovation Plan for Graduate Students of Jiangsu Higher Education Institutions,China(CXZZ12_0183);National Natural Science Foundation of China(61101119);Natural Science Foundation of Jiangsu Province of China(BK2011699);Key Laboratory of Photoelectronic Imaging Technology and System,Beijing Institute of Technology,Ministry of Education of China(2013OEIOF04)