Project supported by the National Key Research and Development Project of China(Grant No.2016YFB0400100);the Hi-tech Research Project of China(Grant Nos.2014AA032605 and 2015AA033305);the National Natural Science Foundation of China(Grant Nos.61274003,61422401,51461135002,and61334009);the Natural Science Foundation of Jiangsu Province,China(Grant Nos.BY2013077,BK20141320,and BE2015111);the Project of Green Young and Golden Phenix of Yangzhou City,the Postdoctoral Sustentation Fund of Jiangsu Province,China(Grant No.1501143B);the Project of Shandong Provinceial Higher Educational Science and Technology Program,China(Grant No.J13LN08);the Solid State Lighting and Energy-saving Electronics Collaborative Innovation Center,Priority Academic Program Development of Jiangsu Higher Education Institutions(PAPD);Research Funds from NJU–Yangzhou Institute of Opto-electronics
Structural characteristics of Alo.55 Gao.45N epilayer were investigated by high resolution x-ray diffraction(HRXRD)and transmission electron microscopy(TEM);the epilayer was grown on GaN/sapphire substrates using ...
By making use of the density functional theory (DFT) of the first principles and generalized gradient approximation method, the electronic structures and properties of ideal GaN and AlxGa1-xN crystals (x = 0.25, 0.5, ...
Supported by the National Natural Science Foundation of China under Grant Nos 60876041, 60577030, 60736033 and 10774001, and the National Basic Research Program of China under Grant Nos 2006CB604908 and 2006CB921607, and the National Key Basic Research Program of China under No TG2007CB307004.
Mg-doped AlxGa1-xN epilayers were grown on AlN/sapphire templates by metal organic chemical vapor depo- sition (MOCVD) using an indium-assisted growth method. At room temperature, the resistivity of Mg-doped Alo.43G...