Supported by the National Natural Science Foundation of China (No.60006002);the Education Department of Guangdong Province of China (No.02019).
The circuit testable realization and its fault detection for logic functions with ESOP (EXOR-Sum-Of-Products) expressions are studied. First of all, for the testable realization by using XOR gate cascade, a test set...
Supported by the National Natural Science Foundation of China (No.60006002);the Education Department of Guangdong Province of China (No.02019).
The circuit testable realizations of multiple-valued functions are studied in this letter. First of all,it is shown that one vector detects all skew faults in multiplication modulo circuits or in addi-tion modulo circ...
Supported by the National Natural Science Foundation of China (60006002) and Natural Science Research Project of Education Depart-ment of Guangdong Province of China (02019)
The main task of system reliability design is to find the best layout of components to maximize reliability or to minimize cost. A reliability optimization approach using neural networks to identify the choice of comp...
Supported by the National Natural Science Foun-dation of China (60006002) ;Natural Science Research Project of Education Department of Guangdong Province of China (02019)
With the complexity of integrated circuits is continually increasing, a local defect in circuits may cause multiple faults. The behavior of a digital circuit with a multiple fault may significantly differ from that of...