Two-dimensional(2D)transition metal dichalcogenides(TMDs)have proved to possess exceptional catalytic performance for hydrogen evolution and are considered to be an appropriate substitute for commercial Pt-based catal...
Supported by the National Natural Science Foundation of China under Grant Nos 10375004 and 10575007, and the Bilateral China-Belgium Cooperation under Grant No BIL04/05. The authors thank Dr K. Cheng for providing the GaN samples.
Two hexagonal GaN epilayers (samples A and B) with multiple buffer layers and single buffer layer are grown on Si (111) by metal-organic vapour phase epitaxy (MOVPE). From the results of Rutherford backscatteri...
Supported by the National Natural Science Foundation of China under Grant No 60376007, the Research Grants Council of the Hong Kong Special Administrative Region of China under Grant Nos CityU 122805 and CityU 123806, and Beijing Natural Science Foundation under Grant No 4072007.
A boron nitride (BN)/silicon p-n heterojunction is fabricated by implanting beryllium (Be) ions into the BN films deposited by rf sputtering on n-type Si (111) substrates. The FTIR observations indicate that the...
Supported by the National Key Basic Research Programme of China under Grant No 2002CB311900, and the National Natural Science Foundation of China under Grant Nos 10474126 and 10574148.
Canti-bridged epitaxial lateral overgrowth (CBELO) of GaN is performed by metalorganic chemical vapour deposition (MOCVD) on maskless V-grooved sapphire substrates prepared by wet chemical etching with different m...
Supported by the Special Fund for Major State Basic Research Project of China under Grant Nos 2006CB604905 and 2006CB604907, the National Natural Science Foundation of China under Grant Nos 6039072, 60476030, 60421003 and 60676057, the Great Fund of Ministry of Education of China (10416), the Research Fund for the Doctoral Programme of Higher Education of China (20050284004), and the Natural Science Foundation of Jiangsu Province (BK2005210, BK2006126).
We study the growth of AlxGa1-x N epilayers on (0001) sapphire by low-pressure MOCVD, using a lowtemperature AIN buffer. By varying the input flow rates of trimethylgallium (TMGa), we obtain crack-free AlGaN films...
Supported by the National Natural Science Foundation in China under Grant No 60476010, the Science and Technology Committee of the Shanghai Municipality (04QMX1407), the National Basic Research Programme of China under Grant No 2006CB302703, and the International Research Training Group (Materials and Concepts for Advanced Interconnects).
The polycrystalline ruthenium films are grown on TaN substrates by atomic layer deposition (ALD) using bis(cyclopentadienyl) ruthenium [RuCp2] and oxygen as ruthenium precursor and reactant respectively at a depos...
Ge1-x Cx films with GeC content up to 11.6% can be prepared by using a medium frequency magnetron sputtering technique in our study. X-ray photoelectron analysis for these Ge1-x Cx films shows that the Ge1-x Cx films ...
Supported by the National Natural Science Foundation of China under Grant Nos 10375004 and 10575007, and the Bilateral Cooperation between China and Belgium under Grant No BIL04/05.
Rutherford backscattering (RBS)/channelling and high resolution x-ray diffraction (HRXRD) have been used to characterize the tetragonal distortion of a GaN epilayer with four Alx Ga1-xN and single AIN buffer layer...
InN and In0.46 Ca0.54N films are grown on sapphire with a CaN buffer by metalorganic chemical vapour deposition (MOCVD). Both high resolution x-ray diffraction and high resolution transmission electron microscopy re...
Supported by the National Natural Science Foundation of China under Grant No 60577040, the Shanghai Foundation of Applied Materials Research and Development (0404), the Nano-technology Project of Shanghai (0452nm051, 05nm05046), and the Shanghai Leading Academic Disciplines (T0101).
By means of electron assisted hot filament chemical vapour deposition technology, nanocrystalline diamond films are deposited on polished n-(100)Si wafer surface at I kPa gas pressure. The deposited films are charac...