采用美国宾州大学开发的AMPS(Analysis of Microelectronic and Photonic Structures)软件模拟了p/i界面缺陷态密度(Npt/i)和非晶孵化层厚度(d)对pin型氢化微晶硅(μc-Si∶H)薄膜太阳电池性能的影响。结果表明:随着Ntp/i的增大,电池的...
Project supported by the National Key Basic Research Program of China (Grant No. 2006CB202601);the Natural Science Foundation of Henan Province of China (Grant No. 82300443203)
The scaling behaviour of surface roughness evolution of microcrystalline silicon (/zc-Si:H) films prepared by very- high frequency plasma-enhanced chemical vapour deposition (VHF-PECVD) has been investigated by u...