Project supported by the National Natural Science Foundation of China(Grant Nos.61006059 and 61774012);Beijing Municipal Natural Science Foundation,China(Grant No.4143059);Beijing Municipal Education Committee,China(Grant No.KM201710005027);Postdoctoral Science Foundation of Beijing,China(Grant No.2015ZZ-11);China Postdoctoral Science Foundation(Grant No.2015M580951);Scientific Research Foundation Project of Beijing Future Chip Technology Innovation Center,China(Grant No.KYJJ2016008)
Based on the thermal network of the two-dimensional heterojunction bipolar transistors(HBTs) array, the thermal resistance matrix is presented, including the self-heating thermal resistance and thermal coupling resist...
supported by the National Key Research and Development Program of China (2016YFA0200300, 2016YFA0200400);the National Science and Technology Major Project of China (2016ZX02301001);the National Natural Science Foundation of China (61574083, 61434001);the National Basic Research Program of China (2015CB352101);Special Fund for Agroscientific Research in the Public Interest of China (201303107);Research Fund from Beijing Innovation Center for Future Chip;support of the Independent Research Program of Tsinghua University (2014 Z01006);Beijing Natural Science Foundation (4184091);Shenzhen Science and Technology Program (JCYJ2015083119 2224146)
In this work, the device performances of discrete and integrated SiGe heterojunction bipolar transistors(HBTs) with different device structures from 300 to 4.8 K were investigated. The turn-on voltages of baseemitter ...
The total ionizing radiation(TID) response of commercial NPN silicon germanium hetero-junction bipolar transistors(Si Ge HBTs) produced domestically are investigated under dose rates of 800 m Gy(Si)/s and 1.3 m...
The performance of low frequency noise(LFN)in SiGe heterojunction bipolar transistors(HBTs)is presented.The experimental results indicate that the performance of LFN in SiGe HBTs agrees with classical LFN theory.Based...
supported by the National Natural Science Foundation of China(Grant Nos.60776051,61006059,and 61006044);the Beijing Municipal Natural Science Foundation,China(Grant Nos.4142007,4143059,4082007,and 4122014);the Beijing Municipal Education Committee,China(Grant Nos.KM200710005015 and KM200910005001)
As is well known, there exists a tradeoff between the breakdown voltage BVcEO and the cut-off frequency fT for a standard heterojunction bipolar transistor (HBT). In this paper, this tradeoff is alleviated by collec...
An analytical model is used to predict the effects of surface recombination current on the gain and transit time of GalnP/GaAs heterojunction bipolar transistors(HBTs).The present analysis shows that consideration o...
The thermal and electro stability of multi-finger heterojunction bipolar transistors (HBTs) with different structures were analyzed and discussed simultaneously. The thermal stability of the devices with different l...
National Natural Science Foundation of China (60776051 and 60376033);Beijing Municipal Natural Science Foun-dation,China (4082007);State 973 project, Beijing Municipal Education Committee,China (KM200710005015);Beijing Municipaltrans -century Talent Project (67002013200301);Young Science Foundation of BJUT (97002013200701);Ph.D Start Science Foundation of BJUT(52002013200701);the 6th Science and Technology Postgraduate Foundation of BJUT(ykj -2007-1970)