supported by the State Key Development Program for Basic Research of China(No.2006CB302704)
MOS capacitors with hafnium oxynitride(HfON)gate dielectrics were fabricated on Ge and Si substrates using the RF reactive magnetron sputtering method.A large amount of fixed charges and interface traps exist at the...
supported by the China Postdoctoral Science Foundation (No.20080431176);the Shandong Special Fund for Postdoctoral Innovative Project (No.200702027);the Doctoral Fund of the Ministry of Education of China (No.200804221006)
With HfON filling the holes in porous silicon (PS), films with improved photoluminescence (PL) at room temperature were prepared. A strong blue peak at 425 nm and a red peak at 690 nm were observed in PL spectra. ...