Project supported by the National Basic Research Program of China(Grant Nos.2011CB301905 and 2013CB328705);the National High Technology Research and Development Program of China(Grant No.2009AA03A198);the National Natural Science Foundation of China(Grant Nos.61076012 and 61376012)
The degradation mechanism of high power InGaN/GaN blue light emitting diodes (LEDs) is investigated in this paper. The LED samples were stressed at room temperature under 350-mA injection current for about 400 h. Th...
Project supported by the National Basic Research Program of China (Grant No.2007CB307004);the National High Technology Research and Development Program of China (Grant No.2009AA03A198);the National Natural Science Foundation of China (Grant Nos.60776041 61076012,60876063,and 60676032);the Science and Technology Fund of Beijing,China (Grant No.Z101103050410003)
Two strain-state samples of GaN, labelled the strain-relief sample and the quality-improved sample, were grown by hydride vapour phase epitaxy (HVPE), and then characterized by high-resolution X-ray diffraction, pho...