supported by the National Natural Science Foundation of China(Nos.61574048,61204112);the Guangdong Natural Science Foundation(No.2014A030313656)
Low-frequency noise behavior in the MOSFETs processed in 65 run technology is investigated in this paper.Low-frequency noise for NMOS transistors agrees with McWhorter's theory(carrier number fluctuation),low-frequ...
supported by the National Natural Science Foundation of China(Grant No.61204112)
AlGaN/GaN high electron mobility transistors (HEMTs) were irradiated by 256 MeV 127I ions with a fluence up to 1 × 10^10 ions/cm2 at the HI-13 heavy ion accelerator of the China Institute of Atomic Energy. Both th...
Supported by National Natural Science Foundation of China(Nos.11179003,10975164,61204112 and 61204116);China Postdoctoral Science Foundation(No.2014M552170)
Experimental evidence is presented showing obvious azimuthal dependence of single event upsets(SEU) and multiple-bit upset(MBU) patterns in radiation hardened by design(RHBD) and MBU-sensitive static random access mem...