This work was supported by the National Key Basic Research and Development Programme of China (No. G2000028202 and G2000028203); Guangdong Provincial Natural Science Foundation of China (No. 05300378) ;Programme on Natural Science of Jinan University (No. 51204056).
Raman spectra and scanning electron microscope (SEM) techniques were used to determine the structural properties of microcrb'stalline silicon (μc-Si:H) films deposited on different substrates with the very high...