supported by the National Natural Science Foundation of China(Grant Nos.61076079 and 61274092);the Doctoral Program Fund of the Ministry of Education of China(Grant No.20090203110012);the Major Program and State Key Program of the National Natural Science Foundation of China(GrantNo.60890191)
Photoluminescence (PL) measurement is used to study the point defect distribution in a GaN terahertz Gunn diode, which is able to the degrade high-field transport characteristic during further device operation. PL, ...
supposed by the National Basic Research Program of China(No.2010CB327503);the National Natural Science Foundation of China(No.60890191)
The impacts of varying layout geometries on the channel temperature of multi-finger AIGaN/GaN HEMTs are investigated by three-dimensional (3-D) thermal simulations. Micro-Raman thermography is selected to obtain a d...
Project supported by the National Key Science & Technology Special Project of China (Grant No. 2008ZX01002-002);the Major Program and State Key Program of National Natural Science Foundation of China (Grant No. 60890191)
An A1GaN/GaN superlattice grown on the top of a GaN buffer induces the broadening of the full width at half maximum of (102) and (002) X-ray diffraction rocking curves. With an increase in the Si-doped concentrati...
Project supported by the National Basic Research Program of China(No.2010CB327503);the National Natural Science Foundation of China(No.60890191)
We report a high power Ku band internally matched power amplifier (IMPA) with high power added efficiency (PAE) using 0.3 μm A1GaN/GaN high electron mobility transistors (HEMTs) on 6H-SiC substrate. The intemal...
supported by the State Key Program and Major Program of National Natural Science Foundation of China (Grant Nos. 60736033 and 60890191);the Fundamental Research Funds for the Central Universities (Grant No. JY10000925002)
AlGaN/GaN metal-insulator-semiconductor high electron-mobility transistors (MIS-HEMTs) with atomic layer deposited (ALD) NbA10 gate dielectric were investigated using 3 MeV proton irradiation at a fluence of 1015 ...
supported by the National Natural Science Foundation of China (Grant Nos.60736033,60890191);the Fundamental Research Funds for the Central Universities (Grant Nos.JY10000925002,JY10000-904009)
In this paper, we systematically study the positive gate leakage current in AlGaN/GaN metal-oxide-semiconductor high electron-mobility transistors (MOS-HEMTs) with HfO 2 dielectric using atomic layer deposition (ALD)....
Project supported by the National Basic Research Program of China (Grant No.2010CB327503);the National Natural Science Foundation of China (Grant No.60890191)
The current voltage (IV) characteristics are greatly influenced by the dispersion effects in A1GaN/CaN high electron mobility transistors. The direct current (DC) IV and pulsed IV measurements are performed to giv...
Project supported by the National Basic Research Program of China(No.2010CB327503);the National Natural Science Foundation of China(No.60890191)
A high power density monolithic power amplifier operated at Ku band is presented utilizing a 0.3μm AlGaN/GaN HEMT production process on a 2-inch diameter semi-insulating(SI) 4H-SiC substrate by MOCVD. Over the 12-1...