financially supported by the National Natural Science Foundation of China(No.U0734006);Shenzhen Tongfang Electronic New Material Co.,Ltd
The growth rule of the interfacial intermetallic compound (IMC) and the degradation of shear strength of Sn-0.SAg-0.5Cu-2.0Bi-0.05Ni (SACBN)/Cu solder joints were investigated in comparison with Sn-3.0Ag-0.5Cu (S...