the National Natural Science Foun-dation of China(Grant Nos.92265113,12074368,12304560,and 12034018);China Postdoctoral Science Foundation(Grant Nos.BX20220281 and 2023M733408).
Scaling up spin qubits in silicon-based quantum dots is one of the pivotal challenges in achieving large-scale semiconductor quantum computation.To satisfy the connectivity requirements and reduce the lithographic com...
supported by National Natural Science Foundation of China (12234005);the Fundamental Research Funds for the Central Universities。
Three-dimensional stacked transistors based on Si/SiGe heterojunction are a potential candidate for future low-power and high-performance computing in integrated circuits.Observing and accurately measuring strain in S...
Project supported by the National Science Fund for Distinguished Young Scholars(Grant No.11925407);the Basic Science Center Program of the National Natural Science Foundation of China(Grant No.61888102);the Key Research Program of Frontier Sciences of CAS(Grant No.ZDBS-LYJSC019);CAS Project for Young Scientists in Basic Research(Grant No.YSBR-026)。
The achievement of universal quantum computing critically relies on scalability.However,ensuring the necessary uniformity for scalable silicon electron spin qubits poses a significant challenge due to the considerable...
Supported by the National Natural Science Foundation of China under Grant No 61306126
Higher-s dielectric LaLuO3, deposited by molecular beam deposition, with TiN as gate stack is integrated into high-mobility Si/SiGe/SOI quantum-well p-type metal-oxide-semiconduetor field effect transistors. Threshold...
In this paper, a p-i-n heterojunction based on strain-compensated Si/Si1-xGex/Si multiple quantum wells on relaxed Si1-yGey is proposed for photodetection applications. The Si1-yGey/Si/Si1-xGex/Si/Si1-yGey stack consi...
Projects(51308040203,6139801)supported by National Ministries and Commissions,China;Projects(72105499,72104089)supported by the Fundamental Research Funds for the Central Universities,China;Project(2010JQ8008)supported by the Natural Science Basic Research Plan in Shaanxi Province of China
A physically based analytical model was developed to predict the performance of the plateau observed in the gate C-V characteristics of strained-Si/SiGe pMOSFET.Experimental results were used to validate this model.Th...