Project(Z135060009002)supported by the Ministry of Industry and Information Technology of China;Project(KZ202010005004)supported by Beijing Municipal Commission of Education and Beijing Municipal Natural Science Foundation of China。
Wafer bin map(WBM)inspection is a critical approach for evaluating the semiconductor manufacturing process.An excellent inspection algorithm can improve the production efficiency and yield.This paper proposes a WBM de...
the support of the Maintenance Department of Mobin Co.;Sungun Copper mine
Equipment plays an important role in open pit mining industry and its cost competence at efficient operation and maintenance techniques centered on reliability can lead to significant cost reduction.The application of...