AlN/GaN superlattice buffer is inserted between GaN epitaxiai layer and Si substrate before epitaxiai growth of GaN layer. High-quality and crack-free GaN epitaxiai layers can be obtained by inserting AlN/GaN superlat...
AlGaN/AlN/GaN high electron mobility transistor (HEMT) structures with a high-mobility GaN thin layer as a channel are grown on high resistive 6H-SiC substrates by metalorganic chemical vapor deposition. The HEMT st...
The influence of polarization-induced electric fields on the electron distribution and the optical properties of intersubband transitions (ISBT) in AlxGa(1-x)N/GaN coupled double quantum wells (DQWs) is investig...
Magnetotransport properties of two-dimensional electron gases (2DEG) in AlxGa1-x N/GaN heterostructures with different Al compositions are investigated by magnetotransport measurements at low temperatures and in hig...
Project supported by Special Funds for Major State Basic Research Project(G2000683 and 2002CB311903);Nationel Natural Foundation of China(60136020);Key Imnovation Program of Chinese Academy of Science and National High Technology R&D Pogram of China(2002AA305304)
The surface morphology of GaN grown by MOCVD on GaN/Si template was studied.Rough morphology and deep pinhole defects on some surface areas of the samples were observed and studied.The formation of rough morphology is...
Project supported by Special Funds for Major State Basic Research Project (G20000683 and 2002CB311903); National Natural Science Foundation of China (60136020); Key Innovation Program of Chinese Academy of Science and National High Technology R&D Program of China (2002AA305304)
High resistivity unintentionally doped GaN films were grown on (0001) sapphire substrates by metalorganic chemical vapor deposition. The surface morphology of the layer was measured by both atomic force microscopy and...
Project supported by the National Natural Science Foundation of China (60406002, 60325413 and 60136020), the Natural Science Foundation of Jiangsu Province (BK2003411)
A theoretical calculation of the miscibility gap with considering the mismatch strain and elastic parameters was performed for the GaN1-xPx ternary alloys on (0001) GaN/sapphire substrates based on the strictly regula...